JOURNAL / ISSUES               ISSN 2310-6697 / ISSN-L 2310-6697
 
open transactions on independent scientific-engineering research
FUNKTECHNIKPLUS # JOURNAL
Théorie-Expérimentation-Métrologie-Logiciel-Applications
 

ISSUE 2 - SUNDAY 17 NOVEMBER 2013 - YEAR 1

 
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2-1
 
# Applied Electromagnetics - Théorie
 
Direct and Related Far-Field Inverse
Scattering Problems for Spherical
Electromagnetic Waves in Chiral Media
 
N. M. Berketis
 
ABSTRACT
 
This paper studies the direct and inverse scattering problem when the incident electromagnetic field is a time harmonic point - generated wave in a chiral media and the scatterer is a perfectly conducting sphere. The exact Green’s function and the electric far-field patterns of the scattering problem are constructed. For a small sphere, a closed-form approximation of the scattered wave field at the source of the incident spherical wave is obtained. Also treats the same inverse problem using far-field results via the leading order term in the low-frequency asymptotic expansion of the scattering cross-section.
 
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2-2
 
# Electrical Engineering - Expérimentation
 
Experimental Results on the Behavior of
Water Droplets on Polymeric Surfaces Under
the Influence of Electric Fields: the Case
of an Inclined Test Arrangement for PVC,
Rubber and Silicone Rubber
 
M. G. Danikas, P. Ramnalis, R. Sarathi
 
ABSTRACT
 
This paper investigates the influence of various parameters on the behavior of water droplets on polymeric surfaces under electric fields. An inclined plane test was carried out to understand the droplet behavior in strong electric field. Parameters such as, water droplet conductivity, droplet volume, polymeric surface roughness and droplet positioning with respect to the electrodes were studied. The flashover voltage is affected by all aforementioned parameters. The droplet positioning is in some cases more vital than the droplet volume.
 
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2-3
 
# Telecommunications Engineering - Métrologie
 
Measurement Uncertainty in Network Analyzers:
Differential Error Analysis of Error Models
Part 3: Short One-Port Calibration - Comparison
 
N. I. Yannopoulou, P. E. Zimourtopoulos
 
ABSTRACT
 
In order to demonstrate the usefulness of the only one existing method for systematic error estimation in VNA (Vector Network Analyzer) measurements by using complex DERs (Differential Error Regions), we compare one-port VNA measurements after the two well-known calibration techniques: the quick reflection response, that uses only a single S (Short circuit) standard, and the time-consuming full one-port, that uses a triple of SLO standards (Short circuit, matching Load, Open circuit). For both calibration techniques, the comparison concerns: (a) a 3D geometric representation of the difference between VNA readings and measurements, and (b) a number of presentation figures for the DERsand their polar DEIs (Differential Error Intervals) of the reflection coefficient, as well as, the DERs and their rectangular DEIs of the corresponding input impedance. In this paper, we present the application of this method to an AUT (Antenna Under Test) selected to highlight the existence of practical cases in which the time consuming calibration technique results a systematic error estimation stripe including almost all of that of quick calibration.
 
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